JEOL EM-BSR Transmission Electron Microscope Rotation Holder

The JEOL EM-BSR Rotation Holder is a specialized transmission electron microscope (TEM) accessory designed for positioning and rotating specimens during high-resolution electron microscopy investigations. Manufactured by JEOL, this specimen holder is used in advanced materials science laboratories, electron microscopy facilities, nanotechnology research centres, universities and scientific research institutions.

The EM-BSR Rotation Holder is designed to provide controlled specimen orientation inside a compatible transmission electron microscope. Specimen rotation is an important capability in electron microscopy because it allows researchers to observe materials from different orientations and investigate their structural characteristics, crystalline features and internal morphology.

The holder is engineered as an elongated precision assembly that interfaces with the specimen positioning mechanism of a compatible TEM. Its extended shaft allows the specimen to be introduced into the microscope column, while the external control assembly provides access to the rotation mechanism. The mechanical construction is designed to support stable specimen positioning during microscopic examination.

One of the primary applications of the JEOL EM-BSR is the investigation of materials that require different viewing orientations during TEM analysis. By rotating the specimen relative to the incident electron beam, researchers can obtain additional structural information and examine features that may not be visible from a single viewing direction.

Specimen rotation is particularly useful in crystallographic investigations, nanomaterials research, semiconductor characterization, thin-film analysis, metallic material studies and advanced materials research. Changing the specimen orientation can help researchers investigate crystal structures, grain boundaries, interfaces, defects and other microstructural characteristics.

The EM-BSR is also useful for examining nanostructures and materials with complex geometries. Specimen rotation can help reveal structural information from different viewing directions and support the interpretation of transmission electron microscopy images. This capability is valuable in research involving nanoparticles, nanowires, crystalline materials, semiconductor devices and engineered materials.

The holder features a long metallic insertion shaft and an external cylindrical control assembly. Its visible adjustment markings include rotation-related indicators, allowing the operator to monitor the selected position. The external electrical cable and connector form part of the holder assembly and should be inspected to confirm the condition and compatibility of the control connection.

The JEOL EM-BSR Rotation Holder is listed for use with compatible JEOL JEM-100CX through JEM-1200EXII transmission electron microscope models. Compatibility should be checked against the exact microscope model, stage configuration and electrical connection before purchasing or installing the accessory.

In university research laboratories, the holder can support electron microscopy studies involving metals, ceramics, polymers, semiconductors and nanostructured materials. In industrial research environments, it can be useful for materials characterization, failure analysis, product development and microstructural investigations.

The EM-BSR is an important accessory for laboratories that require additional specimen manipulation capabilities beyond those provided by standard TEM specimen holders. Its specialized design allows researchers to investigate samples from different orientations, helping improve the amount of structural information obtained during microscopy experiments.

The holder is particularly relevant to advanced research facilities where transmission electron microscopy is used for detailed examination of material structure at the nanometre scale. It can support scientific studies involving crystallography, material defects, phase identification, interfaces and nanoscale structural analysis.

The JEOL EM-BSR Rotation Holder combines precision specimen positioning with a dedicated rotation mechanism in a specialized TEM accessory. Its compatibility with selected JEOL transmission electron microscopes makes it a valuable component for laboratories performing advanced microscopy and materials science research.

Overall, the JEOL EM-BSR Rotation Holder is a specialized laboratory accessory intended for controlled specimen rotation during transmission electron microscopy. It is suitable for electron microscopy centres, university laboratories, materials research institutions, semiconductor research facilities and nanotechnology laboratories.

Important: The exact microscope compatibility, rotation range, electrical control requirements and specimen mounting configuration should be verified using the holder's identification and the corresponding JEOL microscope documentation before purchase.

Application of Product

1. Transmission electron microscopy (TEM) specimen examination.

2. Specimen rotation during electron microscopy.

3. Crystallographic analysis and crystal orientation studies.

4. Nanomaterials characterization.

5. Semiconductor material analysis.

6. Thin-film microstructural investigation.

7. Metal and alloy characterization.

8. Nanoparticle and nanowire analysis.

9. Grain boundary and defect examination.

10. Materials science and engineering research.

11. Advanced microscopy and academic research.

12. Structural analysis of crystalline materials.

2.2 Features of Product

• Designed for compatible JEOL transmission electron microscopes.

• Specialized EM-BSR rotation holder configuration.

• Specimen rotation capability.

• Precision specimen positioning mechanism.

• Extended metallic insertion shaft.

• External rotation control assembly.

• Rotation position indicators.

• Electrical cable and connector assembly.

• Designed for electron microscopy applications.

• Suitable for advanced materials characterization.

• Supports examination of specimens from different orientations.

• Specialized accessory for research-grade TEM systems.

2.3 Technical Specifications

Exact technical specifications, rotation range and electrical requirements should be confirmed from the original JEOL documentation for the EM-BSR model.

2.4 Product Condition

Condition: Used / Refurbished – To be confirmed.

• Physical appearance: As shown in the photograph.

• Mechanical shaft: Visually present.

• Rotation control assembly: Present.

• Electrical cable: Visible.

• Connector: Present.

• Rotation mechanism: Requires functional testing.

• Specimen mounting tip: Requires inspection.

• Microscope compatibility: Must be confirmed before sale.

• Accessories: Subject to availability.